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fei helios nanolab 600i focused ion beam (fib) instrument  (NanoLab Inc)

 
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    Structured Review

    NanoLab Inc fei helios nanolab 600i focused ion beam (fib) instrument
    Fei Helios Nanolab 600i Focused Ion Beam (Fib) Instrument, supplied by NanoLab Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/fei+helios+nanolab+600i+focused+ion+beam+(fib)+instrument/focused+ion+beam/pm40289179-193-18-19
    Average 90 stars, based on 1 article reviews
    fei helios nanolab 600i focused ion beam (fib) instrument - by Bioz Stars, 2026-10
    90/100 stars

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    Related Articles

    Sample Prep:

    Article Title: “Self-sharpening” tungsten high-entropy alloy
    Article Snippet: A focused ion beam (FIB) instrument (FEI Helios Nanolab 600i) was also used to accurately prepare TEM samples from deformed samples.

    Article Title: Non-equilibrium nanostructured permanent magnets with excellent magnetic properties over an exceptionally wide temperature range
    Article Snippet: Specimens for TEM and APT were prepared from the hot-deformed magnet using a focused ion beam (FIB) instrument (FEI Helios Nanolab 600i).

    Article Title: Unveiling the Re effect in Ni-based single crystal superalloys
    Article Snippet: Sample preparation for APT was carried out mainly by a dual-beam focused ion beam (FIB) instrument (FEI Helios Nanolab 600i), for both routine APT measurement (tips mounted on Si coupon) and a correlative TEM/APT measurement (tips mounted on half-Mo-grid) , .

    Article Title: Unveiling the mechanism of abnormal magnetic behavior of FeNiCoMnCu high-entropy alloys through a joint experimental-theoretical study
    Article Snippet: Ziyuan Rao,1 Biswanath Dutta ,2 Fritz Körmann,1,2 Dirk Ponge,1 Linlin Li,1 Junyang He ,1 Leigh Stephenson,1 Lukas Schäfer,3 Konstantin Skokov ,3 Oliver Gutfleisch,3 Dierk Raabe,1 and Zhiming Li 1,4,* 1Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straße 1, 40237 Düsseldorf, Germany 2Materials Science and Engineering, Delft University of Technology, Mekeleweg 2, 2628 CD Delft, The Netherlands 3Institut für Materialwissenschaft, Technische Universität Darmstadt, Alarich-Weiss-Straße 16, 64287 Darmstadt, Germany 4School of Materials Science and Engineering, Central South University, 410083 Changsha, China

    Article Title: Atomic diffusion induced degradation in bimetallic layer coated cemented tungsten carbide
    Article Snippet: Specimen characterisation Both APT and (S)TEM specimens were fabricated using a dual eam focused-ion-beam (FIB) instrument (FEI Helios Nanolab 00/600i) and the in-situ lift-out method [40,41].

    Transmission Electron Microscopy:

    Article Title: “Self-sharpening” tungsten high-entropy alloy
    Article Snippet: A focused ion beam (FIB) instrument (FEI Helios Nanolab 600i) was also used to accurately prepare TEM samples from deformed samples.

    Article Title: Non-equilibrium nanostructured permanent magnets with excellent magnetic properties over an exceptionally wide temperature range
    Article Snippet: Specimens for TEM and APT were prepared from the hot-deformed magnet using a focused ion beam (FIB) instrument (FEI Helios Nanolab 600i).

    Article Title: Unveiling the Re effect in Ni-based single crystal superalloys
    Article Snippet: Sample preparation for APT was carried out mainly by a dual-beam focused ion beam (FIB) instrument (FEI Helios Nanolab 600i), for both routine APT measurement (tips mounted on Si coupon) and a correlative TEM/APT measurement (tips mounted on half-Mo-grid) , .

    Article Title: Unveiling the mechanism of abnormal magnetic behavior of FeNiCoMnCu high-entropy alloys through a joint experimental-theoretical study
    Article Snippet: Ziyuan Rao,1 Biswanath Dutta ,2 Fritz Körmann,1,2 Dirk Ponge,1 Linlin Li,1 Junyang He ,1 Leigh Stephenson,1 Lukas Schäfer,3 Konstantin Skokov ,3 Oliver Gutfleisch,3 Dierk Raabe,1 and Zhiming Li 1,4,* 1Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straße 1, 40237 Düsseldorf, Germany 2Materials Science and Engineering, Delft University of Technology, Mekeleweg 2, 2628 CD Delft, The Netherlands 3Institut für Materialwissenschaft, Technische Universität Darmstadt, Alarich-Weiss-Straße 16, 64287 Darmstadt, Germany 4School of Materials Science and Engineering, Central South University, 410083 Changsha, China

    Article Title: Atomic diffusion induced degradation in bimetallic layer coated cemented tungsten carbide
    Article Snippet: Specimen characterisation Both APT and (S)TEM specimens were fabricated using a dual eam focused-ion-beam (FIB) instrument (FEI Helios Nanolab 00/600i) and the in-situ lift-out method [40,41].



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